Preparation of samples using Focused Ion Beam (FIB) to create microscopy lamella, followed by in situ Scanning Transmission Electron Microscopy (STEM) imaging. Generate best-in-class data through quality control and continuous improvement. Proper handling of sensitive customer samples and intellectual property. Work with process engineers to understand how to locate regions of interest, best process their samples, interpreting data, and troubleshooting when data does not meet expectations. Communicate with team members to facilitate technique transfers, pass down sample learnings, and advance the state of the art in semiconductor microscopy. Maintain integrity of experiments and data to provide valid results. Actively participate in developing new techniques to expedite sample processing. Provide new learnings and developments to other team members through documentation, presentations, and training sessions Collaborate with process engineers. Participate in evaluating new instruments for lab growth. Foster a healthy and inclusive working environment. Maintain a professional atmosphere and cordial working relationships. Adhere to Lam's Core Values Experience working in an academic or professional laboratory setting. Experience operating electron microscopes and/or dual beam focused ion beams. Bachelor's degree in Material Science, Chemistry, or Physics Experience creating technical documentation. M.S with 1+ year of experience operating focused ion beams (FIB). B.S with 3+ years of relevant work experience. Experience with TEM sample preparation is highly desirable. Hands-on experience of Thermo Fisher Helios series tools. Knowledge of semiconductor devices and industry. Candidate should possess good written and verbal communication skills to work with large internal customer base.